Web1 ago 2003 · JEDEC JESD92. This document defines a constant voltage stress test procedure for characterizing time-dependent dielectric breakdown or “wear-out” of thin … Web17 ott 2024 · I am a 4th year PhD candidate at the University of British Columbia supervised by Dr. Tor Aamodt. My research focuses on the field of Computer / GPU architecture and Graphics. Currently working on ray tracing accelerators and GPU architecture. Learn more about Yuan Hsi (Tommy) Chou's work experience, education, connections & more by …
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JESD-92 Procedure for Characterizing Time-Dependent Dielectric ...
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